The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2019

Filed:

Sep. 15, 2015
Applicant:

Temasek Life Sciences Laboratory Limited, Singapore, SG;

Inventors:

Muthukaruppan Swaminathan, Singapore, SG;

Tobias Sjoblom, Uppsala, SE;

Ian Cheong, Singapore, SG;

Obdulio Piloto, Coral Gables, FL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/46 (2006.01); G06K 9/52 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6276 (2013.01); G06K 9/00986 (2013.01); G06K 9/52 (2013.01); G06K 9/627 (2013.01); G06K 9/6215 (2013.01); G06K 2009/4666 (2013.01);
Abstract

An improved system and method for digital image classification is provided. A host computer having a processor is coupled to a memory storing thereon reference feature data. A graphics processing unit (GPU) having a processor is coupled to the host computer and is configured to obtain, from the host computer, feature data corresponding to the digital image; to access, from the memory, the one or more reference feature data; and to determine a semi-metric distance based on a Poisson-Binomial distribution between the feature data and the one or more reference feature data. The host computer is configured to classify the digital image using the determined semi-metric distance.


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