The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2019
Filed:
Aug. 25, 2015
Agency for Science, Technology and Research, Singapore, SG;
Fengshou Yin, Singapore, SG;
Wing Kee Damon Wong, Singapore, SG;
Jiang Liu, Singapore, SG;
Beng Hai Lee, Singapore, SG;
Zhuo Zhang, Singapore, SG;
Kavitha Gopalakrishnan, Singapore, SG;
Ying Quan, Singapore, SG;
Ai Ping Yow, Singapore, SG;
AGENCY FOR SCIENCE, TECHNOLOGY AND RESEARCH, Singapore, SG;
Abstract
A method of assessing the quality of an retinal image (such as a fundus image) includes selecting at least one region of interest within a retinal image corresponding to a particular structure of the eye (e.g. the optic disc or the macula), and a quality score is calculated in respect of the, or each, region-of-interest. Each region of interest is typically one associated with pathology, as the optic disc and the macula are. Optionally, a quality score may be calculated also in respect of the eye as a whole (i.e. over the entire image, if the entire image corresponds to the retina).