The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2019
Filed:
Feb. 27, 2017
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-Do, KR;
Inventors:
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5081 (2013.01); G06F 17/5072 (2013.01); G06F 2217/06 (2013.01); G06F 2217/12 (2013.01);
Abstract
An integrated circuit of a semiconductor device is fabricated by forming patterns on a wafer in conformance with a layout of the patterns. A method for verifying the layout includes providing a virtual pattern on a predicted defect point in the layout, and identifying at least one pattern from among those of the layout using the virtual pattern. The predicted defect point corresponds to a weak point where it is determined in advance that a defect will occur when the layout is transcribed on a wafer. The identified pattern is a pattern that is adjacent to the virtual pattern in the layout.