The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2019
Filed:
Aug. 17, 2016
Applicant:
Amber Precision Instruments, Inc., San Jose, CA (US);
Inventors:
Giorgi Muchaidze, Campbell, CA (US);
Besarion Chikhradze, Santa Clara, CA (US);
Hamed Kajbaf, Los Angeles, CA (US);
Assignee:
AMBER PRECISION INSTRUMENTS, INC., San Jose, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G01R 31/3183 (2006.01); G01R 31/28 (2006.01); G01R 1/073 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5081 (2013.01); G01R 31/287 (2013.01); G01R 31/2887 (2013.01); G01R 31/318364 (2013.01); G06F 17/5068 (2013.01); G01R 1/07328 (2013.01);
Abstract
A system and method for testing a device under test (DUT) combines measurement data of field components values made at different sampling locations away from the DUT with computer-aided design layout of the DUT. The combined computer-aided design layout of the DUT and the measurement data can then be displayed for analysis.
Quick Actions:
Muchaidze, Giorgi. (2019). Using computer-aided design layout in scanning system (U.S. Patent No. 10325057). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10325057
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile