The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2019
Filed:
Nov. 07, 2017
Sas Institute Inc., Cary, NC (US);
Mahesh V. Joshi, Cary, NC (US);
Richard Potter, Cary, NC (US);
Jan Chvosta, Raleigh, NC (US);
Mark Roland Little, Cary, NC (US);
SAS INSTITUTE INC., Cary, NC (US);
Abstract
Techniques for estimated compound probability distribution are described herein. Embodiments may include receiving a compound model specification comprising a frequency model and a severity model, the compound model specification including a model error comprising a frequency model error and a severity model error, and determining a number of frequency models and severity models to generate based on the received number of models to generate. Embodiments include generating a plurality of frequency models through perturbation of the frequency model according to the frequency model error, and generating a plurality of severity models through perturbation of the severity model according to the severity model error. Further, embodiments include dividing generation of a plurality of compound model samples among a plurality of distributed worker nodes, and receiving the plurality of compound model samples from the distributed worker nodes, and generating aggregate statistics from the plurality of compound model samples.