The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2019
Filed:
Jun. 30, 2015
Emc Corporation, Hopkinton, MA (US);
Shelesh Chopra, Karanataka, IN;
Swapnadeep Deb Kanunjna, Karanataka, IN;
EMC IP HOLDING COMPANY LLC, Hopkinton, MA (US);
Abstract
Embodiments describe methods, apparatuses, and systems for performing data analytics on one or more features of software under development. In one exemplary embodiment, a data mining module receives a first set of data including an expected timeline of a plurality of features of program code being developed. The data mining module further retrieves a second set of data from a program testing system based on the first set of data. The second set of data includes defect information and a testing result for each of the plurality of features indicated in the first set of data. Moreover, a data analysis module executed performs an analysis on the first and second sets of data. Based on the analysis, a report generator generates an analysis report that includes an expected defect level and an actual defect level of each of the plurality of features.
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