The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2019

Filed:

Aug. 21, 2015
Applicant:

Graphika, Inc., New York, NY (US);

Inventors:

John W. Kelly, New York, NY (US);

Vladimir D. Barash, Somerville, MA (US);

Adam Fields, New York, NY (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 3/0484 (2013.01); G06F 16/9535 (2019.01); G06Q 10/10 (2012.01); G06Q 30/02 (2012.01); G06F 16/28 (2019.01); G06F 16/21 (2019.01); G06F 16/27 (2019.01);
U.S. Cl.
CPC ...
G06F 3/04842 (2013.01); G06F 16/212 (2019.01); G06F 16/278 (2019.01); G06F 16/285 (2019.01); G06F 16/9535 (2019.01); G06Q 10/10 (2013.01); G06Q 30/02 (2013.01);
Abstract

Computerized search methods and systems generally include presenting, to a user, a computer interface for specifying one or more search terms for a search query and presenting at least one selectable item corresponding to at least one of art M score and a cluster focus index (CFI) score filter for the search query. The methods and systems include generating an amended search query based on a selected item; and performing a search using the amended search query. The M score is calculated using the formula M score=count (alpha)+CFI (1-alpha), where the count is the overall number of members on a cluster focus map that has engaged with a target.


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