The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2019
Filed:
Nov. 25, 2016
Carl Zeiss Meditec Ag, Jena, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
A surgical system has a surgical microscope with an imaging optical unit and a control unit for setting imaging parameters of the microscope. The system further has an image processing device for overlaying an overlay image stored in the image processing device with an image generated by the microscope. A data processing unit is connected to the control unit of the microscope and to the image processing device. The control unit is configured such that, before a change of at least one imaging parameter of the microscope from a first value to a second value, it stores both the first value and the second value and makes them available to the data processing unit. The image processing device is configured in such a manner that it modifies the overlay image in a manner corresponding to the stored first and second values of the at least one imaging parameter.