The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2019
Filed:
May. 11, 2017
Applicant:
Olympus Corporation, Hachioji-shi, Tokyo, JP;
Inventor:
Tadashi Kotani, Tokyo, JP;
Assignee:
OLYMPUS CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 21/08 (2006.01); F21V 8/00 (2006.01); G02B 21/36 (2006.01); H04N 5/238 (2006.01); G02B 6/14 (2006.01);
U.S. Cl.
CPC ...
G02B 21/082 (2013.01); G02B 6/0008 (2013.01); G02B 6/14 (2013.01); G02B 21/36 (2013.01); H04N 5/238 (2013.01);
Abstract
Provided is a microscope system including: an optical fiber in which laser light emitted from a light-source apparatus propagates; a microscope that irradiates a specimen with the laser light propagated in the optical fiber and that obtains an image of the specimen; a mode-scrambling device portion that causes elastic waves to propagate in the optical fiber to form elastic wave interference fringes in the optical fiber; and a control device that controls the driving of the mode-scrambling device.