The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2019
Filed:
Jul. 21, 2014
Z Terra Inc., Houston, TX (US);
Ioan Sturzu, Houston, TX (US);
Alexander M. Popovici, Katy, TX (US);
Tijmen J. Moser, The Hague, NL;
Iulian F. Musat, Katy, TX (US);
Nicolay Tanushev, Houston, TX (US);
Z TERRA INC., Houston, TX (US);
Abstract
In some embodiments, a seismic processing method comprises assembling a specularity gather by determining a specularity value at each of a plurality of subsurface locations, and summing trace amplitudes into a plurality of bins, each bin characterized by a range of specularity values. The specularity value at a subsurface location is computed according to an angle between a normal to a local reflector and a direction of a total (source+receiver) traveltime gradient. For example, the specularity may be proportional to (e.g. equal to) a magnitude of the cosine of the angle. A diffraction image may be generated by summing specularity gather data over specularity, with specular event amplitudes attenuated relative to diffractive event amplitudes.