The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2019
Filed:
Mar. 02, 2017
Applicant:
Shanghai United Imaging Healthcare Co., Ltd., Shanghai, CN;
Inventors:
Guobin Li, Shanghai, CN;
Chaohong Wang, Shanghai, CN;
Assignee:
SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD., Shanghai, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/54 (2006.01); G01R 33/561 (2006.01); A61B 5/055 (2006.01); G01R 33/48 (2006.01); G01R 33/28 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5617 (2013.01); A61B 5/055 (2013.01); G01R 33/4808 (2013.01); G01R 33/543 (2013.01); G01R 33/5615 (2013.01); A61B 5/0042 (2013.01); A61B 5/425 (2013.01); A61B 5/4244 (2013.01); A61B 5/4519 (2013.01); A61B 5/4528 (2013.01); A61B 5/4566 (2013.01); A61B 5/4571 (2013.01); A61B 5/4585 (2013.01); A61B 5/7257 (2013.01); A61B 2576/026 (2013.01); G01R 33/288 (2013.01);
Abstract
A system and method for calculating a flip angle schedule is provided. The technique includes selecting an initial condition, providing a function for calculating flip angles, calculating flip angles, assessing the flip angles, and repeating the calculation of the flip angles by adjusting the function until a desired flip angle schedule is obtained.