The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2019
Filed:
Apr. 05, 2017
National Cheng Kung University, Tainan, TW;
Kuen-Jong Lee, Tainan, TW;
Jhen-Zong Chen, Pingtung County, TW;
National Cheng Kung University, Tainan, TW;
Abstract
A test decompressor and a test method thereof for converting original input data of one single test input into test vectors for testing a circuit under test (CUT) containing scan chains are revealed. The test decompressor includes a test data spreader, a test configuration switch, and a test controller. The test data spreader converts the original input data into a plurality of test data. The test configuration switch receives the original input data and the plurality of test data and transfers these data to scan chains of the CUT. The test controller receives the original input data and outputs a select signal to the test configuration switch for switching current test configuration to another test configuration. The scan chains in the CUT are divided into several scan groups and the scan chains in each scan group share the same test data. Thus the test data volume can be significantly reduced.