The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2019
Filed:
Sep. 15, 2015
Semiconductor Energy Laboratory Co., Ltd., Atsugi-shi, Kanagawa-ken, JP;
Yasuhiko Takemura, Kanagawa, JP;
Semiconductor Energy Laboratory Co., Ltd., Kanagawa-ken, JP;
Abstract
Provided is a method for measuring a current that a component of a matrix device can supply. A device including components (pixels) arranged in a matrix, first wirings, and second wirings and third wirings which cross the first wirings is used. Each component includes a potential supply circuit, a transistor, and a capacitor. The device is designed as follows: at a point in time, one electrode of the capacitor has a potential equal to that of a gate of the transistor, the other electrode of the capacitor has a potential equal to that of the second wiring, one of a source and a drain of the transistor has a potential equal to that of the first wiring, and the other of the source and the drain of the transistor has a potential equal to that of the third wiring; and the potential of the second wiring and the potential of the third wiring in the case where each component supplies the first wiring with a current in a given direction are different from the potential of the second wiring and the potential of the third wiring in the case where each component supplies the first wiring with a current in the opposite direction.