The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2019
Filed:
Aug. 22, 2017
Robert E. Richardson, King George, VA (US);
Michael B. Slocum, Colonial Beach, VA (US);
Robert E. Richardson, King George, VA (US);
Michael B. Slocum, Colonial Beach, VA (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
An apparatus is provided for determining an electromagnetic (EM) characteristic of a material, including a chamber, an antenna, a transmitter, a receiver and a processor. The chamber includes a permanent boundary that encloses a volume; a removable panel along the boundary. The panel includes the material. The antenna is disposed in the chamber for transmitting source EM radiation and receiving reflected EM radiation. The transmitter injects the source EM radiation via the antenna into the chamber. The source EM radiation includes continuous wave (CW) and pulse signals. The receiver obtains reverberated EM radiation from the chamber via the antenna and produces an intermediate frequency signal. The processor controls the transmitter and the receiver. The processor determines a decay time of the EM radiation from the intermediate frequency signal. The material is a test substance for comparison with a calibration reference substance on the removable panel having an established EM characteristic in the chamber, based on the decay time for the reference substance. The processor determines the EM characteristic from a decay time of the test substance and a reference decay time of the reference substance.