The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2019

Filed:

Oct. 26, 2012
Applicants:

Tews Elektronik Gmbh & Co. KG, Hamburg, DE;

Aiger Group Ag, Zug, CH;

Inventors:

Dimitar Yankov Yanchev, Plovdiv, BG;

Udo Schlemm, Hamburg, DE;

Rainer Herrman, Hamburg, DE;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 22/00 (2006.01); A24C 5/34 (2006.01); A24D 3/02 (2006.01);
U.S. Cl.
CPC ...
G01N 22/00 (2013.01); A24C 5/3412 (2013.01); A24D 3/0295 (2013.01);
Abstract

A method for online measurement of a plasticizer in an endless filter rod, includes: measuring a resonance shift (A) and line broadening (B) with a microwave resonator at a passing endless filter rod, determining a mass per length of plasticizer from the measurement variables (A, B), measuring a reference mass of plasticizer applied per time with the application of the plasticizer onto the filter tow band, determining an averaged reference mass per length of plasticizer from the measured mass applied over a time period, averaging the values for mass per length of plasticizer, determined using the measurement variables over the same time in which the reference mass of plasticizer is determined, determining a deviation between the averaged reference value for the mass per length and averaged mass per length and correcting the mass per length, determined from the measurement variables of the microwave resonator, according to the determined deviation.


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