The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2019
Filed:
May. 04, 2017
Chung Yuan Christian University, Taoyuan, TW;
Tzong-Rong Ger, Taoyuan, TW;
Wei-Yu Chen, New Taipei, TW;
Ting-Ruei Wang, Taipei, TW;
Hsiao-Hsuan Huang, New Taipei, TW;
Wen-Wei Sun, Pingtung County, TW;
Wan-Ying Huang, New Taipei, TW;
CHUNG YUAN CHRISTIAN UNIVERSITY, Taoyuan, TW;
Abstract
The present invention provides a magnetophorisis measuring system, comprising a microscope device, a magnetic field generator, an image capturing unit, and a processing unit. The microscope device is utilized to magnify a sample liquid having a plurality of objects respectively having a plurality of magnetic particles. The magnetic field generator is utilized to provide an external magnetic field on the sample liquid such that the objects are moved by the external magnetic field. The image capturing unit is utilized to capture a dynamic image with respect to the fluid sample in a view field of the microscope device. The processing unit receives the dynamic image, automatically detects and locks moving objects, determines a motion status corresponding to each object, and quantifies the magnetic particles according to motion status of each object.