The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2019

Filed:

Oct. 04, 2017
Applicant:

Ch2m Hill, Inc., Englewood, CO (US);

Inventors:

Ben Thompson, Englewood, CO (US);

Michael Novak, Englewood, CO (US);

Michael Niemet, Englewood, CO (US);

Assignee:

CH2M HILL, INC., Englewood, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/22 (2006.01); G01N 33/38 (2006.01);
U.S. Cl.
CPC ...
G01N 1/2214 (2013.01); G01N 33/383 (2013.01);
Abstract

Disclosed herein is a passive vapor intrusion measurement device including a barrier layer having first and second major sides; an absorbent stack disposed on a first portion of the surface of the barrier layer first major side, the absorbent stack including a first absorbent layer, an optional second absorbent layer; and spacer layer(s) disposed between the first and second (if present) absorbent layer and the barrier layer; and an adhesive disposed on a second portion of the surface of the barrier layer first major side and transversely surrounding the absorbent stack. The device is applied to a substrate in need of vapor intrusion sampling. A method of vapor intrusion analysis includes individually collecting the first and second (if present) absorbent layers after a test period; analyzing the amount of an analyte the absorbent layer(s); and subtracting the amount of the analyte in the second absorbent layer (if present) from the amount of the analyte in the first absorbent layer.


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