The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2019
Filed:
Aug. 17, 2017
Applicant:
Sikora Ag, Bremen, DE;
Inventors:
Assignee:
Sikora AG, Bremen, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/00 (2006.01); G01J 5/00 (2006.01); G01J 5/08 (2006.01); G01J 5/10 (2006.01); G01J 5/52 (2006.01); C03B 37/025 (2006.01);
U.S. Cl.
CPC ...
G01J 5/0003 (2013.01); G01J 5/0022 (2013.01); G01J 5/0096 (2013.01); G01J 5/0887 (2013.01); G01J 5/10 (2013.01); G01J 5/522 (2013.01); C03B 37/0253 (2013.01); C03B 2205/72 (2013.01); G01J 5/0806 (2013.01); G01J 2005/0048 (2013.01);
Abstract
A method for determining the temperature of a strand comprises disposing the strand along a background radiator of known temperature. Receiving the strand using a spatially resolving thermal imaging sensor in front of the background radiator while the strand is being disposed along its longitudinal axis. Forming an integral across a measuring value area, the integral configured to detect a complete strand portion located in front of the background radiator of the thermal imaging sensor. deducing the temperature of the strand by comparing the formed integral with a reference value.