The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2019
Filed:
Nov. 10, 2015
Applicant:
Pratt & Whitney Canada Corp., Longueuil, CA;
Inventors:
Reza Pedrami, Montreal, CA;
Kaveh Moezzi Madani, Montreal, CA;
Assignee:
PRATT & WHITNEY CANADA CORP., Longueuil, CA;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01); G05B 13/04 (2006.01); G01D 5/244 (2006.01);
U.S. Cl.
CPC ...
G01D 18/00 (2013.01); G01D 5/2449 (2013.01); G01D 5/24452 (2013.01); G01D 5/24471 (2013.01); G01D 5/24476 (2013.01); G05B 13/04 (2013.01);
Abstract
There are described herein methods and systems for estimating a system parameter in a closed loop scheme using a sensor model associated with a sensor performing a measurement of the system parameter. Past and current measurements of the parameter are used to provide an initial estimate of the system parameter and sensor dynamics are used to refine the estimated parameter.