The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2019
Filed:
Jun. 29, 2018
System and method for optics testing using a plano holographic null incorporating alignment features
Eagle Technology, Llc, Melbourne, FL (US);
Cormic K Merle, Rochester, NY (US);
Eugene G. Olczak, Pittsford, NY (US);
Malcolm Nash O'Sullivan, Pittsford, NY (US);
EAGLE TECHNOLOGY, LLC, Melbourne, FL (US);
Abstract
An alignment reference module (ARM) for detecting an alignment of a hologram with respect to a spindle axis of a spindle that supports an optic device under test (DUT). The hologram is employed for testing an optical surface of the DUT. The ARM includes a flat portion having a reflective surface for reflecting light back toward the hologram member to detect tilting of the hologram relative to the spindle axis. The ARM also includes a spherical portion having a reflective surface adjacent the flat portion for transmitting light back toward the hologram member to detect a radial position of the hologram relative to the spindle axis.