The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2019

Filed:

Jun. 09, 2017
Applicant:

Keyence Corporation, Osaka, JP;

Inventors:

Masaki Fujiwara, Osaka, JP;

Shigeto Murakami, Osaka, JP;

Takashi Nakatsukasa, Osaka, JP;

Assignee:

Keyence Corporation, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); G06T 7/521 (2017.01); H04N 5/247 (2006.01);
U.S. Cl.
CPC ...
G01B 11/25 (2013.01); G06T 7/521 (2017.01); G06T 2207/10152 (2013.01); G06T 2207/30164 (2013.01); H04N 5/247 (2013.01);
Abstract

Provided is a measuring device having improved operability. A head unit is fixedly coupled to an installation part with a stand. A measuring object is placed on a stage held by the installation part. The measuring object is irradiated obliquely downward with the measurement light having the pattern from the light projecting unit. The measurement light reflected obliquely upward by the measuring object is received by a selected one of first and second light receiving units, and a light reception signal representing a light reception amount is output. A second imaging visual field of the second light receiving unit is smaller than a first imaging visual field of the first light receiving unit, and included in the first imaging visual field. A second optical axis of the second light receiving unit is located below a first optical axis of the first light receiving unit.


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