The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2019
Filed:
Mar. 17, 2015
Hitachi, Ltd., Tokyo, JP;
Hideyuki Noda, Tokyo, JP;
Hiroko Tada, Tokyo, JP;
Chihiro Uematsu, Tokyo, JP;
Masahiro Okanojo, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
Provided is a antimicrobial susceptibility testing device, including: an ATP examination culture plate that includes a reaction vessel, a reagent holding parts for holding reagents to be supplied to the reaction vessel, and a culture solution holding part for holding a culture solution to be supplied to the reaction vessel, and has plural layers that can be joined and separated; a gas feeding path for feeding a gas into the ATP examination culture plate; a heater; an optical detection unit; and a determination unit for determining sensitivity of a bacterial strain contained in the culture solution to a drug based on a detection result of the optical detection unit, wherein when the plural layers of the ATP examination culture plate are joined, at least the culture solution holding part and the reaction vessel are in a sealed state while communicating with each other.