The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

Jul. 19, 2016
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventor:

Miki Hayakawa, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04Q 9/00 (2006.01); H04Q 9/02 (2006.01); G06Q 10/06 (2012.01);
U.S. Cl.
CPC ...
H04Q 9/02 (2013.01); G06Q 10/06398 (2013.01); H04Q 9/00 (2013.01); H04Q 2209/40 (2013.01); H04Q 2209/826 (2013.01); H04Q 2209/84 (2013.01); H04Q 2209/88 (2013.01);
Abstract

Provided is a sensor system provided with: a terminal apparatus that has a sensor; and a base station that communicates with the terminal apparatus. The terminal apparatus stores acquisition frequency of a measurement data set to be transmitted to the base station, in measurement data sets of the sensor, and transmits first data that includes a reference time of an acquisition period of the measurement data sets of the sensor and the acquisition frequency, and second data that corresponds to the first data and that includes multiple measurement data sets, of the sensor, which have been acquired at the acquisition frequency in the acquisition period. The base station identifies the acquisition time of each of the measurement data sets included in the second data corresponding to the first data, on the basis of the reference time and the acquisition frequency included in the first data.


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