The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

Oct. 03, 2017
Applicant:

Weltrend Semiconductor Inc., Hsinchu, TW;

Inventors:

Hsuan-Ying Chen, Hsinchu, TW;

Hung-Chih Chiang, Hsinchu, TW;

Shui-Chin Yeh, Hsinchu, TW;

Ming-Liang Chen, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/00 (2011.01); H04N 5/232 (2006.01); G06T 3/40 (2006.01); G06T 5/00 (2006.01); G06T 7/33 (2017.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23238 (2013.01); G06T 3/4038 (2013.01); G06T 5/006 (2013.01); G06T 7/33 (2017.01); H04N 5/23232 (2013.01); H04N 17/002 (2013.01); G06T 2200/32 (2013.01); G06T 2207/30252 (2013.01); H04N 5/23229 (2013.01);
Abstract

A panoramic image stitching method includes acquiring a plurality of first images, converting camera image plane coordinates of each first image of the plurality of first images into virtual image plane coordinates for generating a second image according a world coordinate system, identifying a plurality of feature points on the second image, calibrating coordinates of the plurality of feature points on the second image, generating a calibrated second image according to calibrated coordinates of the plurality of feature points on the second image, and stitching a plurality of calibrated second images for generating a panoramic image.


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