The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2019
Filed:
Jul. 11, 2016
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Se-Hwan Yun, Hwaseong-si, KR;
Daekwan Kim, Suwon-si, KR;
Chaesung Kim, Seoul, KR;
DongKi Min, Seoul, KR;
Samsung Electronics Co., Ltd., Gyeonggi-do, KR;
Abstract
An image apparatus may be configured to calculate a depth of an object relative to the image apparatus. The image apparatus may include an image sensor that may capture a plurality of images of the object. Depth calculation may include calculating a binocular disparity using the plurality of images, measuring a local temperature value from at least one temperature sensor, correcting a focal length of at least a portion of the image apparatus according to the measured local temperature value, and calculating a depth of the object using the binocular disparity and the corrected focal length. The corrected focal length may be determined based on a focal length variation value. The focal length variation value may be determined based on performing contrast autofocus on one or more captured images and the local temperature value.