The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2019
Filed:
Dec. 28, 2015
Silicon Laboratories Inc., Austin, TX (US);
Yunteng Huang, Palo Alto, CA (US);
Adam B. Eldredge, Frisco, TX (US);
Gregory J. Richmond, Cupertino, CA (US);
Silicon Laboratories Inc., Austin, TX (US);
Abstract
Techniques for generating a fail safe clock signal improves reliability of one or more output clock signals generated based on one or more input clock signals and an internally generated reference clock signal. By continuously monitoring the frequencies of the one or more input clock signals and reducing or eliminating effects of any static frequency offset between multiple input clock signals, the fail safe clock generator can detect very small relative frequency changes between the inputs or within a particular input. By comparing the input clock frequencies against a reference clock signal frequency over time of a clock signal generated by an internal oscillator, the fail safe clock generator may further detect which one of multiple input clocks has frequency deviation. The fail safe clock generator uses an internal oscillator generating a reference clock signal having a short-term stable frequency.