The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2019
Filed:
Sep. 06, 2016
Applicant:
SK Hynix Inc., Icheon-si Gyeonggi-do, KR;
Inventors:
Do Yun Lee, Yongin-si, KR;
Chang Hyun Kim, Seoul, KR;
Assignee:
SK hynix Inc., Icheon-si, Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 7/04 (2006.01); G11C 29/52 (2006.01); G11C 7/10 (2006.01); G11C 11/4076 (2006.01); G06F 11/10 (2006.01); G11C 5/14 (2006.01); G11C 7/24 (2006.01); G11C 11/4074 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G11C 29/52 (2013.01); G06F 11/106 (2013.01); G11C 7/04 (2013.01); G11C 7/1006 (2013.01); G11C 11/4076 (2013.01); G11C 5/14 (2013.01); G11C 7/24 (2013.01); G11C 11/4074 (2013.01); G11C 2029/0409 (2013.01);
Abstract
A semiconductor device may include an operation control circuit configured to generate a detection signal based on an internal temperature of the semiconductor device. The semiconductor device may include an error correction circuit configured to output read data as output data with or without performing an error correction operation and with or without performing a scrub operation based on the detection signal.