The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

Sep. 18, 2016
Applicant:

Thomson Licensing, Issy les Moulineaux, FR;

Inventors:

Laurent Blonde, Thorigne-Fouillard, FR;

Mozhdeh Seifi, Thorigne-Fouillard, FR;

Paul Kerbiriou, Thorigne-Fouillard, FR;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/60 (2017.01); H04N 17/00 (2006.01); G06T 5/00 (2006.01); G06T 5/20 (2006.01); G06T 7/80 (2017.01); H04N 5/228 (2006.01);
U.S. Cl.
CPC ...
G06T 7/60 (2013.01); G06T 5/003 (2013.01); G06T 5/20 (2013.01); G06T 7/80 (2017.01); H04N 17/002 (2013.01); G06T 2200/21 (2013.01); G06T 2207/10052 (2013.01); G06T 2207/20036 (2013.01); G06T 2207/20048 (2013.01);
Abstract

A method of calibrating an image acquisition device is described. The method includes emitting at least one light source pattern in an object space of the image acquisition device, adjusting one of the source patterns until an image pattern of the source pattern formed on a sensor of the image acquisition device exhibit a shape which centroid corresponds to a centroid of a reference pixel of the sensor, called a target image pattern and analyzing the adjusted source pattern and estimating therefrom at least one characteristic of a pixel beam directed to the reference pixel from the adjusted source pattern.


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