The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

Jun. 26, 2014
Applicant:

D-wave Systems Inc., Burnaby, CA;

Inventors:

Geordie Rose, Vancouver, CA;

Suzanne Gildert, Vancouver, CA;

William G. Macready, West Vancouver, CA;

Dominic Christoph Walliman, Vancouver, CA;

Assignee:

D-WAVE SYSTEMS INC., Burnaby, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 99/00 (2019.01); G06N 20/00 (2019.01); G06N 10/00 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 10/00 (2019.01); G06N 99/002 (2013.01); G06N 99/005 (2013.01); G06N 99/00 (2013.01);
Abstract

Systems, methods and aspects, and embodiments thereof relate to unsupervised or semi-supervised features learning using a quantum processor. To achieve unsupervised or semi-supervised features learning, the quantum processor is programmed to achieve Hierarchal Deep Learning (referred to as HDL) over one or more data sets. Systems and methods search for, parse, and detect maximally repeating patterns in one or more data sets or across data or data sets. Embodiments and aspects regard using sparse coding to detect maximally repeating patterns in or across data. Examples of sparse coding include L0 and L1 sparse coding. Some implementations may involve appending, incorporating or attaching labels to dictionary elements, or constituent elements of one or more dictionaries. There may be a logical association between label and the element labeled such that the process of unsupervised or semi-supervised feature learning spans both the elements and the incorporated, attached or appended label.


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