The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2019
Filed:
Oct. 18, 2011
Daniel J. Byrne, New York, NY (US);
Mark W. Byrne, New York, NY (US);
Robert R. Friedlander, Southbury, CT (US);
Richard Hennessy, Austin, TX (US);
James R. Kraemer, Santa Fe, NM (US);
Daniel J. Byrne, New York, NY (US);
Mark W. Byrne, New York, NY (US);
Robert R. Friedlander, Southbury, CT (US);
Richard Hennessy, Austin, TX (US);
James R. Kraemer, Santa Fe, NM (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A processor-implemented method, computer program product, and/or computer system predicts a future event. A first bit array, which describes characteristics of a single entity while experiencing a first event, is generated using values received from a set of physical test devices. After the first single entity experiences a different second event, a second bit array is generated from another set of physical test devices. The second bit array describes characteristics of an event cohort, which is made up of entities, other than the single entity, which also experience the second event, but which never experienced the first event. When another single entity experiences the first event, a determination is made as to whether that other single entity has characteristics from both the first bit array and the second bit array. If so, a prediction is made that the other single entity will also experience the second event.