The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

May. 19, 2016
Applicant:

Life Technologies Corporation, Carlsbad, CA (US);

Inventors:

Francis T. Cheng, Palo Alto, CA (US);

Chengyong Yang, Foster City, CA (US);

Casey McFarland, San Francisco, CA (US);

Ying Wang, Chicago, IL (US);

Assignee:

Life Technologies Corporation, Carlsbad, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01N 25/04 (2006.01); C12Q 1/6816 (2018.01); C12Q 1/6827 (2018.01); G06F 19/22 (2011.01); G06F 19/24 (2011.01);
U.S. Cl.
CPC ...
G06F 19/22 (2013.01); C12Q 1/6816 (2013.01); C12Q 1/6827 (2013.01); G01N 21/6428 (2013.01); G01N 25/04 (2013.01); G06F 19/24 (2013.01); G01N 2021/6439 (2013.01);
Abstract

The present application provides for various embodiments of methods for the analysis of high resolution melt (HRM) curve data; where statistical assay variations in melt curve data may result from system noise in an analysis system. Such system noise may arise from various sources, such as the thermal non-uniformity of a thermocycler block in a thermal cycler apparatus, a detection system, etc. Additionally, various methods for the analysis of HRM curve data may provide an identification of a sample without the need for a user inputted information.


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