The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2019
Filed:
Jun. 09, 2017
Applicant:
Sap SE, Walldorf, DE;
Inventors:
Edward-Robert Tyercha, Heidelberg, DE;
Gerrit Simon Kazmaier, Heidelberg, DE;
Hinnerk Gildhoff, Heidelberg, DE;
Isil Pekel, Heidelberg, DE;
Lars Volker, Karlsruhe, DE;
Tim Grouisborn, Mannheim, DE;
Assignee:
SAP SE, Walldorf, DE;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/22 (2019.01); G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06F 16/285 (2019.01); G06F 16/221 (2019.01);
Abstract
DBSCAN clustering analyses can be improved by pre-processing of a data set using a Hilbert curve to intelligently identify the centers for initial partitional analysis by a partitional clustering algorithm such as CLARANS. Partitions output by the partitional clustering algorithm can be process by DBSCAN running in parallel before intermediate cluster results are merged.