The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

Mar. 31, 2015
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Stephen G. Graham, Chapel Hill, NC (US);

Eron D. Wright, San Ramon, CA (US);

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 16/182 (2019.01); G06F 16/951 (2019.01);
U.S. Cl.
CPC ...
G06F 16/182 (2019.01); G06F 16/951 (2019.01);
Abstract

A distributed object store can expose object metadata, in addition to object data, to distributed processing systems, such as Hadoop and Apache Spark. The distributed object store may acts as a Hadoop Compatible File System (HCFS), exposing object metadata as a collection of records that can be efficiently processed by MapReduce (MR) and other distributed processing frameworks. A distributed processing job can specify a metadata query to narrow the set of objects returned. Related methods are also described.


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