The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

May. 11, 2017
Applicant:

Lawrence Livermore National Security, Llc, Livermore, CA (US);

Inventors:

Ryan D Muir, Livermore, CA (US);

John E Heebner, San Ramon, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/35 (2006.01); G02F 1/355 (2006.01);
U.S. Cl.
CPC ...
G02F 1/3517 (2013.01); G02F 1/3556 (2013.01); G02F 2201/20 (2013.01); G02F 2203/07 (2013.01);
Abstract

Single-shot transient optical signals are recorded in a time regime of picoseconds to nanosecond. An auxiliary pump beam is crossed through the signal to sample a diagonal 'slice' of space-time, analogous to a rolling shutter. The slice is then imaged onto an ordinary camera, where the recorded spatial trace is a direct representation of the time content of the signal. The pump samples the signal by optically exciting carriers that modify the refractive index in a conventional semiconductor wafer. Through use of birefringent retarders surrounding the wafer, the integrating response of the rapidly excited but persistent carriers is differentiated by probing with two polarization-encoded time-staggered signal replicas that are recombined to interfere destructively.


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