The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

Aug. 21, 2017
Applicant:

Shenzhen China Star Optoelectronics Technology Co., Ltd., Shenzhen, CN;

Inventor:

Yuan Xiong, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1362 (2006.01); G02F 1/1335 (2006.01); H01L 27/12 (2006.01); H01L 23/544 (2006.01); H01L 21/027 (2006.01); H01L 21/68 (2006.01); G02F 1/1333 (2006.01);
U.S. Cl.
CPC ...
G02F 1/136209 (2013.01); G02F 1/133512 (2013.01); H01L 21/0273 (2013.01); H01L 21/681 (2013.01); H01L 23/544 (2013.01); H01L 27/1288 (2013.01); G02F 2001/133354 (2013.01); G02F 2001/136222 (2013.01); H01L 2223/54426 (2013.01);
Abstract

A manufacture method of a black matrix is provided. The COA technology is utilized to manufacture organic photoresist blocks with an increased thickness on alignment marks. Then, a black matrix thin film is set on and covers the organic photoresist blocks to tremendously increase the level differences of the positions of the alignment marks and adjacent areas. A contour recognition apparatus can accurately recognize positions of the alignment marks. The issue that the alignment marks are difficult to recognize after the black matrix thin film is coated in the BOA process can be solved.


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