The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

Nov. 22, 2016
Applicant:

Ventana Medical Systems, Inc., Tucson, AZ (US);

Inventors:

William Roland Hawes, Hertfordshire, GB;

Martin Philip Gouch, Hertfordshire, GB;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/26 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G02B 21/26 (2013.01); G02B 21/367 (2013.01);
Abstract

A microscope scanning apparatus is provided comprising a detector array for obtaining an image from a sample and a sample holder adapted to hold the sample when in use and to move relative to the detector array along a scan path. A controller is further provided to monitor the position of the sample holder relative to the detector array and to trigger image capture by the detector array in accordance with said monitored position.


Find Patent Forward Citations

Hawes, William. (2019). Method and apparatus for imaging a sample using a microscope scanner (U.S. Patent No. 10317666). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10317666

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…