The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

Dec. 19, 2014
Applicants:

Centre National DE LA Recherche Scientifique, Paris, FR;

Institut D'optique Graduate School, Palaiseau, FR;

Universite Paris Sud 11, Orsay, FR;

Inventor:

Arnaud Dubois, Orsay, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G01B 9/02 (2006.01); A61B 90/00 (2016.01); G02B 21/33 (2006.01); G02B 21/36 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G02B 21/0064 (2013.01); A61B 90/37 (2016.02); G01B 9/02091 (2013.01); G02B 21/008 (2013.01); G02B 21/0032 (2013.01); G02B 21/0056 (2013.01); G02B 21/33 (2013.01); G02B 21/367 (2013.01); G06T 7/0012 (2013.01); A61B 2090/3735 (2016.02); G02B 21/0036 (2013.01); G06T 2207/10072 (2013.01); G06T 2207/30004 (2013.01);
Abstract

An optical tomography apparatus comprises: a polychromatic light source, a one-dimensional optical sensor, an interferometric microscope, a one-dimensional confocal spatial filtering system, an actuation system making it possible to perform a one-way scan depthwise of an object to be observed and a processor for reconstructing a two-dimensional image of a section of the object from a plurality of one-dimensional interferential images acquired by the image sensor during the one-way scan. An optical tomography method based on use of such an apparatus is also provided.


Find Patent Forward Citations

Loading…