The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2019
Filed:
Aug. 17, 2015
The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);
Noy Cohen, Stanford, CA (US);
Marc S. Levoy, Stanford, CA (US);
Michael J. Broxton, San Francisco, CA (US);
Logan Grosenick, Brooklyn, NY (US);
Samuel Yang, Stanford, CA (US);
Aaron Andalman, San Francisco, CA (US);
Karl A. Disseroth, Stanford, CA (US);
Mark A. Horowitz, Menlo Park, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);
Abstract
Various aspects of the present disclosure are directed toward optics and imaging. As may be implemented with one or more embodiments, an apparatus includes one or more phase masks that operate with an objective lens and a microlens array to alter a phase characteristic of light travelling in a path from a specimen, through the objective lens and microlens array and to a photosensor array. Using this approach, the specimen can be imaged with spatial resolution characteristics provided via the altered phase characteristic, which can facilitate construction of an image with enhanced resolution.