The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

Apr. 19, 2016
Applicant:

Halliburton Energy Services, Inc., Houston, TX (US);

Inventors:

Mehdi Eftekhari Far, Humble, TX (US);

Natasa Mekic, Spring, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 1/30 (2006.01); G01V 1/42 (2006.01); G01V 99/00 (2009.01);
U.S. Cl.
CPC ...
G01V 1/307 (2013.01); G01V 1/306 (2013.01); G01V 1/308 (2013.01); G01V 1/42 (2013.01); G01V 99/005 (2013.01); G01V 2210/1295 (2013.01); G01V 2210/1299 (2013.01); G01V 2210/161 (2013.01); G01V 2210/612 (2013.01); G01V 2210/6222 (2013.01); G01V 2210/646 (2013.01); G01V 2210/74 (2013.01);
Abstract

Disclosed herein are embodiments of systems, methods, and computer program products for determining fracture and stress characterization using layer thickness variation over an azimuthally anisotropic medium, which may include one or more of the following functions: acquiring seismic data by recording reflected seismic waves in at least two directions; sorting of the seismic data so that offset is zero at a center and increases radially from a single common-point (CMP) gather for a plurality of data points; generating a multi-dimensional volume by juxtaposing a set of common-offset sections by one of their common-depth point (CDP) and CMP locations; selecting reflectors for each layer in the one of the multi-dimensional volume; computing layer parameters including effective anisotropy and interval anisotropy for each layer in the multi-dimensional volume based on a geometry of the reflectors selected for each layer in the multi-dimensional volume; and applying the layer parameters to an earth model.


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