The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2019
Filed:
Aug. 30, 2013
Applicants:
Wenyi HU, Katy, TX (US);
Lorie K. Bear, Shenandoah, TX (US);
Hongchuan Sun, Spring, TX (US);
Carey M. Marcinkovich, The Woodlands, TX (US);
Inventors:
Wenyi Hu, Katy, TX (US);
Lorie K. Bear, Shenandoah, TX (US);
Hongchuan Sun, Spring, TX (US);
Carey M. Marcinkovich, The Woodlands, TX (US);
Assignee:
ExxonMobil Upstream Research Company, Spring, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 1/28 (2006.01); G01V 1/30 (2006.01);
U.S. Cl.
CPC ...
G01V 1/307 (2013.01); G01V 1/282 (2013.01); G01V 1/301 (2013.01); G01V 1/306 (2013.01); G01V 2210/512 (2013.01); G01V 2210/614 (2013.01); G01V 2210/671 (2013.01);
Abstract
Method for reconstructing subsurface Q depth profiles from common offset gathers () of reflection seismic data by performing migration (), ray tracing (), CDP-to-surface takeoff angle finding (), kernel matrix construction (), depth-to-time conversion and wavelet stretching correction (), source amplitude spectrum fitting, centroid frequency shift calculation (), and box-constrained optimization ().