The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

Mar. 26, 2015
Applicant:

Robert Bosch Gmbh, Stuttgart, DE;

Inventors:

Christoph Delfs, Bretten, DE;

Frank Fischer, Gomaringen, DE;

Reiner Schnitzer, Reutlingen, DE;

Niklas Dittrich, Pliezhausen, DE;

Heiko Ridderbusch, Schwieberdingen, DE;

Gael Pilard, Wankheim, DE;

Assignee:

ROBERT BOSCH GMBH, Stuttgart, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/89 (2006.01); G02B 26/08 (2006.01); H01S 5/183 (2006.01); G01S 17/42 (2006.01); G01S 17/58 (2006.01); G01S 7/481 (2006.01); H01S 5/14 (2006.01); H01S 5/026 (2006.01);
U.S. Cl.
CPC ...
G01S 17/42 (2013.01); G01S 7/4814 (2013.01); G01S 7/4817 (2013.01); G01S 17/58 (2013.01); G01S 17/89 (2013.01); G02B 26/0833 (2013.01); H01S 5/14 (2013.01); H01S 5/183 (2013.01); H01S 5/0261 (2013.01); H01S 5/0264 (2013.01); H01S 5/18341 (2013.01);
Abstract

A module for measuring an object located in a position finding zone; the module being configured for generating a primary beam; the module having a scanning mirror structure; the scanning mirror structure being controllable to allow the primary beam to execute a scanning movement within the position finding zone; the module being configured to allow a secondary signal to be detected when the secondary signal is produced in response to the interaction of the primary beam with the object in a deflection position of the scanning mirror structure; the module being configured to generate position finding information as a function of the deflection position of the scanning mirror structure; the module featuring a semiconductor laser component; the semiconductor laser component being configured for producing the primary beam and for detecting the secondary signal.


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