The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

Feb. 20, 2015
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

David Grodzki, Erlangen, DE;

Bjoern Heismann, Erlangen, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/34 (2006.01); G01R 33/48 (2006.01); G01R 33/561 (2006.01);
U.S. Cl.
CPC ...
G01R 33/4824 (2013.01); G01R 33/34 (2013.01); G01R 33/482 (2013.01); G01R 33/5611 (2013.01);
Abstract

In a method for the acquisition of magnetic resonance (MR) data relating to a pre-determined two-dimensional volume segment of an examination object with an MR apparatus, a randomized determination of points to be sampled in the raw data space is made, such that the raw data space is undersampled when only the determined points to be sampled are then sampled. MR data relating to the specified points to be sampled are acquired by operation of the MR apparatus. Alternatively, a determination of points to be sampled in the raw data space is made using radial or spiral trajectories in k-space that begin in the center k-space. Each specified point to be sampled is then moved to an FFT grid point, and MR data relating to the determined points to be sampled is implemented by operation of the MR apparatus.


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