The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10317450 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 11, 2019

Filed:

Jun. 28, 2017
Applicant:

Palacky University Olomouc, Olomouc, CZ;

Inventor:
Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 27/02 (2006.01); G01R 27/26 (2006.01);
U.S. Cl.
CPC ...
G01R 31/001 (2013.01); G01R 27/02 (2013.01); G01R 27/025 (2013.01); G01R 27/2617 (2013.01);
Abstract

The method for measuring of quick changes of low surface conductivity of dielectrics under electromagnetic interference of line voltage is based on a comparison measurement on a voltage divider and synchronization of measuring pulses with periodic sinusoidal course of interference when voltage with pre-set parameters of square pulse is brought to the tested dielectric surface and potential is sampled in the voltage divider consisting of the measured dielectric surface and a resistor with preselected resistivity in certain time intervals both before application of the measuring pulse and immediately before its end, and then based on a difference between the values measured using a differential amplifier, the value corresponding to that measured without effect of electromagnetic interference 60 Hz is derived and the result is the possibility to measure quick changes of low surface conductivity of dielectric surface.


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Fry{hacek over (c)}ák, Petr. (2019). Method for measuring quick changes in low surface conductivity of dielectrics under electromagnetic interference of line voltage and equipment to perform this type of measurement (U.S. Patent No. 10317450). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10317450

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