The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

Mar. 01, 2017
Applicant:

Tdk Corporation, Tokyo, JP;

Inventors:

Masataka Midori, Tokyo, JP;

Hiroshi Kurihara, Tokyo, JP;

Assignee:

TDK CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0892 (2013.01); G01R 29/0878 (2013.01);
Abstract

A radiated emission measuring device includes: an electric field measuring device and an arithmetic processing unit. The arithmetic processing unit performs: a first arithmetic process of creating at least one of an electric field distribution and an electric field strength distribution of the plurality of measurement points measured by the electric field measuring device and inputting zero to at least one of an electric field and electric field strengths at a certain point between two neighboring measurement points; a second arithmetic process of applying a digital low pass filter to at least one of the electric field distribution and the electric field strength distribution obtained in the first arithmetic process; and a third arithmetic process of specifying a position at a maximum electric field strength from at least one of an electric field distribution and an electric field strength distribution obtained in the second arithmetic process.


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