The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2019
Filed:
Mar. 13, 2014
Siemens Aktiengesellschaft, München, DE;
Dominikus Joachim Müller, Eichenau, DE;
Florian Poprawa, München, DE;
Abdellatif Zanati, München, DE;
Siemens Aktiengesellschaft, München, DE;
Abstract
The invention relates to a sensor () for determining a dielectric property of a medium (). The sensor () has a substrate (), which has at least one via (), and a waveguide (), which is arranged so as to be planar in relation to an upper surface of the substrate (). The waveguide () can be connected to an analysis device () by means of the at least one via (). Furthermore, the waveguide () is designed to receive an input signal from the analysis device () and to output an output signal to the analysis device (). When of the waveguide () is in contact with a medium (), properties of the input signal and of the output signal are indicative of the dielectric property of the medium (). The arrangement of the waveguide () so as to be planar in relation to the substrate () enables larger measurement ranges and improved measurement accuracies. Furthermore, a compact construction is achieved by the planar structure. The invention further relates to a sensor arrangement and a method for determining a dielectric property of a medium by means of a sensor.