The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

Dec. 09, 2015
Applicant:

Luminex Corporation, Austin, TX (US);

Inventors:

David R. Torgerson, Round Rock, TX (US);

Matthew S. Fisher, Austin, TX (US);

Assignee:

Luminex Corporation, Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2018.01); G01N 35/00 (2006.01); G16H 40/60 (2018.01); C12Q 1/686 (2018.01);
U.S. Cl.
CPC ...
G01N 35/0092 (2013.01); G16H 40/60 (2018.01); C12Q 1/686 (2013.01); G01N 2035/0094 (2013.01); G01N 2035/0096 (2013.01); G01N 2035/00891 (2013.01);
Abstract

Techniques are disclosed relating to assay configuration. Assay devices are often used to determine characteristics of test samples, e.g., using polymerase chain reaction (PCR) or Deoxyribonucleic Acid (DNA) melt techniques. Various disclosed techniques allow detailed specification of assay parameters. This may allow user modification of assays and/or assay development by third parties. In embodiments in which assay parameters are specified using a separate device, these techniques may reduce validation requirements resulting from modified assays. In some embodiments, assay configuration information that may be added/removed/modified may include: a sequence of operations, parameters for the sequence of operations, data processing parameters, call logic rules/dependencies, and/or reporting rules.


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