The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

Sep. 09, 2015
Applicant:

Shimadzu Corporation, Kyoto-shi, Kyoto, JP;

Inventors:

Motohide Yasuno, Kyoto, JP;

Akiko Imazu, Kyoto, JP;

Assignee:

SHIMADZU CORPORATION, Kyoto-shi, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); G01N 27/68 (2006.01); G01N 27/62 (2006.01); H01J 49/10 (2006.01); H01J 49/40 (2006.01);
U.S. Cl.
CPC ...
G01N 27/68 (2013.01); G01N 27/622 (2013.01); H01J 49/10 (2013.01); H01J 49/40 (2013.01);
Abstract

A first shutter gate is disposed at an entrance of a drift region, and a second shutter gate is disposed on the downstream side in an ion-drifting direction. In a high-resolution measurement mode, a controller () controls voltage generators to open the second shutter gate to collect ions into a pulsed form at the first shutter gate. In this mode, the controller controls the voltage generators to open the first shutter gate to collect ions into a pulsed form at the second shutter gate. In a zoom-in measurement mode where ions within a specified range of ion mobility are measured with high resolving power, the controller controls the voltage generators to open the first shutter gate for a short period of time, and then to open the second shutter gate for a short period of time after a lapse of a predetermined time period.


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