The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

May. 25, 2017
Applicant:

Bruker Daltonik Gmbh, Bremen, DE;

Inventors:

Alexander Harder, Bremen, DE;

Markus Lubeck, Bremen, DE;

Sven Myer, Weyhe, DE;

Detlev Suckau, Grasberg, DE;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/62 (2006.01); G01N 30/72 (2006.01); H01J 49/00 (2006.01); H01J 49/40 (2006.01);
U.S. Cl.
CPC ...
G01N 27/622 (2013.01); G01N 30/7233 (2013.01); H01J 49/004 (2013.01); H01J 49/0031 (2013.01); H01J 49/0045 (2013.01); H01J 49/40 (2013.01);
Abstract

The invention relates to methods for the detailed analysis of ion mixtures from complex mixtures of organic substances in time-of-flight mass spectrometers which are equipped with a trapped ion mobility spectrometer, a quadrupole mass selector and a fragmentation cell. The invention proposes to analyze ion signals of a first mass mobility map, fragment ion spectra and the identifications of the associated substances as to whether ion mixtures not resolved according to mass and mobility, for example from isomers or isobars, are possibly present, and to subsequently measure the ion signals of interest with method parameters which allow the ion species to be measured separately by means of high mobility resolution.


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