The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2019
Filed:
Jul. 01, 2016
The Texas A&m University System, College Station, TX (US);
Muhammad Suhail Zubairy, College Station, TX (US);
Mohammad D. Al-Amri, Riyadh, SA;
Xiaodong Zeng, College Station, TX (US);
The Texas A&M University System, College Station, TX (US);
The National Centre for Applied Physics, KACST, Riyadh, SA;
Abstract
Novel and advantageous systems and methods for performing nanometer-scale microscopy using graphene plasmons (GPs) are provided. Sub-diffraction microscopy can be achieved, taking advantage of the extremely small plasmon wavelength and low dissipation of GPs. Nanometer-scale resolution can be obtained under very weak light intensity, which is especially important in the imaging of biological systems.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile