The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

Jan. 09, 2017
Applicant:

Chemimage Corporation, Pittsburgh, PA (US);

Inventors:

Matthew Nelson, Harrison City, PA (US);

Patrick Treado, Pittsburgh, PA (US);

Charles Gardner, Gibsonia, PA (US);

Andrew Basta, Cranberry Township, PA (US);

Assignee:

ChemImage Corporation, Pittsburgh, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); H01L 27/146 (2006.01); G01N 21/31 (2006.01); G01N 21/359 (2014.01); A61B 5/00 (2006.01); G01J 3/02 (2006.01); G01J 3/12 (2006.01);
U.S. Cl.
CPC ...
G01J 3/2823 (2013.01); A61B 5/0075 (2013.01); G01J 3/0264 (2013.01); G01J 3/12 (2013.01); G01N 21/31 (2013.01); G01N 21/359 (2013.01); H01L 27/14625 (2013.01); G01J 2003/1213 (2013.01); G01J 2003/2826 (2013.01); G01N 2201/1293 (2013.01);
Abstract

The present disclosure provides systems and methods for determining the presence of a target material in a sample. In general terms, the system and method disclosed herein provide collecting interacted photons from a sample having a target material. The interacted photons are passed through a tunable filter to a VIS-NIR detector where the VIS-NIR detector generates a VIS-NIR hyperspectral image representative of the filtered interacted photons. The hyperspectral image of the filtered interacted photons is analyzed by comparing the hyperspectral image of the filtered interacted photons to known hyperspectral images to identify the presence of a target material in a sample. The systems and methods disclosed herein provide easy identification of the presence of a target material in a sample.


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